Atomic Force Microscopy

Two atomic force microscopes are available for the morphological characterization of nanostructured surfaces. The Bruker Multimode 8 AFM features an electrochemical cell for characterizing surface structure in a liquid or electrochemical environment.

Bruker Multimode 8 AFM

• AS-12 Scanner
  • 2.5 µm Z range
  • 10µm X 10µm XY range
  • Probe holder for AFM in air
• Nanoscope V controller
• Electrochemical Cell
  • Liquid probe holder with electrochemical contacts
  • Bruker Universal Biopotentiostat

Bruker Multimode 8 AFM with electrochemical cell.

Park Scientific Instruments Autoprobe CP

• Scanner
  • 5 µm standard configuration
  • 100 µm multitask configuration
  • Magnetic and non-magnetic sample holders
• Probe head for
  • Atomic Force Microscopy
  • Magnetic Force Microscopy
  • Force Modulation Microscopy
  • Phase Detection Microscopy

Park Autoprobe CP AFM.